Flash memory chip failure analysis and testing technology seminar-and the release conference

On September 9, the "Flash Chip Failure Analysis and Testing Technology Seminar-and Futurepath Flash Chip Intelligent Test System Conference" sponsored by Fortune Technology was held in Shenzhen Zhongke Valley Industrial Park.

As we all know, memory chips occupies an important position in the global semiconductor industry and are an important part of the information technology industry. However, the quality of flash memory chips continues to decline with iterations, and the technical standards of various manufacturers are different. In the face of the current industrial market environment, companies How to deal with the impact of the deterioration of flash memory quality is the main topic discussed in this conference.

This meeting invited the China National Information Technology Standardization Network Information Technology Research Center, Shenzhen Computer Industry Association, Shenzhen Institute of Advanced Technology Chinese Academy of Sciences, China GreatWall Technology Group Co., Ltd., Shenzhen Hosinglobal Electronics Co., Ltd., Shenzhen SAGE Electronics Co., Ltd. CEC Tsource Development (Beijing) Co., Ltd., Yangtze Memory Technologies Co., Ltd., BYD Co., Ltd., Skyworth Group Technology Management Co., Ltd., Beijing Starblaze Technology Co., Ltd., YEESTOR Microelectronics Co., Ltd, MAXIO Technology ( Hangzhou) Co., Ltd., CHINESE SCIENCES VALLEY and other important guests attended the conference and delivered speeches. Dr. Liu Zhiquan, Shenzhen Institute of Advanced Technology Chinese Academy of Sciences, Dr. Liu Zhenglin, Professor of Huazhong University of Science and Technology, and Dr. Chen Yicheng from Futurepath Wuhan R&D Center, were the key speakers of this seminar on flash memory chips. Reliability publishes relevant opinions.

Mr. Xiao Jun, Chairman of Fortune Technology, said: "Futurepath is in a rare period of strategic development opportunities, benefiting from the political and economic dividends of domestic substitution of imports, the major development dividends of the semiconductor industry, the policy dividends of the Greater Bay Area, and the deepening reform of the multi-level capital market. With multiple blessings such as dividends, Fortune Technology has entered a broader and high-speed development track. I sincerely hope that we can learn from the industry leaders present here and develop together. The road to the future is to share the Futurepath."

Chen Hai, Director of the China National Information Technology Standardization Network Information Technology Research Center, delivered an important speech.

Director Chen emphasized at the meeting that memory chips account for 20% of the global semiconductor industry and are an important part of the information technology industry, but core technologies have always been highly monopolized by foreign countries. In terms of flash memory test technology, Futurepath has developed relevant verification test tools for storage life prediction, storage reliability analysis, etc., which complements the implementation of the comprehensive evaluation of domestic SSD products and the quality of the industrial development process, and is independent of domestic SSD products. Control development is of great significance to the improvement of the quality of SSD products in the fields of Xinchuang,   industrial control and other fields.

Du Heping, executive chairman of Shenzhen Computer Industry Association, expressed his warm congratulations on the convening of the meeting! He pointed out in his speech: As the semiconductor manufacturing process continues to improve, testing and verification have become more important. Futurepath focuses on R&D and production of flash memory chip test equipment. It is a well-known supplier in this field in China. It joined the association in early 2021 and injected vitality into the development of my country's semiconductor industry. In the future, the association will further integrate upstream and downstream resources, promote in-depth cooperation between enterprises on the chain, and achieve a win-win situation for all parties.

Special lecture by Dr. Zhiquan Liu from Shenzhen Institute of Advanced Technology Chinese Academy of Sciences: Analysis, Testing and Failure Analysis of Electronic Materials and Devices.

Dr. Zhiquan Liu is a researcher at the Shenzhen Institute of Advanced Technology of the Chinese Academy of Sciences, a doctoral supervisor at the University of Chinese Academy of Sciences and the University of Science and Technology of China, the director of the Technology Platform Department of the Shenzhen Institute of Advanced Electronic Materials International Innovation, and an overseas scholar of the Chinese Academy of Sciences’ Hundred Talents Program.

Professor Liu Zhenglin from Huazhong University of Science and Technology: Lecture: Failure and Prevention of Flash Memory Chips

Dr. Zhenglin Liu is a professor at the School of Optics and Electronic Information, Huazhong University of Science and Technology. In 2007, he was selected into the New Century Excellent Talents Program of the Ministry of Education. The research direction covers digital integrated circuits, hardware security, security CPU, car networking security, memory testing, etc.

In recent years, with the continuous in-depth research on flash memory reliability, studies have found that the actual service life of flash memory is much higher than the nominal value, and the original error rate cannot effectively predict uncorrectable errors. In this regard, Dr. Liu Zhenglin proposed a flash memory prevention strategy and method model, and hopes to be applied in the future, such as cloud storage, data center, rail transit and other equipment with service life requirements, so that storage devices can have a longer service life. , Reduce the risk of data loss in large storage devices.

Dr. Chen Yicheng from Futurepath Wuhan R&D Center Special Speech: 3D TLC Process Deviation and Reliability: Challenges and Responses.

Dr. Chen Yicheng is a Ph.D. in solid-state electronics and microelectronics from Huazhong University of Science and Technology. He was selected into the twelfth batch of "3551 Optics Valley Talent Program" in Wuhan. His research interests include military-standard solid-state hard drive design, graphics codec design, and data storage encryption. Technology, encryption and decryption algorithm side channel attack and protection technology, security chip design, etc.

Dr. Chen pointed out that studying the effect of process deviation is critical to the reliability of 3D NAND. Adaptive error prediction can effectively prevent bad results caused by process deviation. On the basis of detection and prediction, a variety of mechanisms can be used to ensure data reliability and increase service life.

Wang Long, general manager of Futurepath's strategy department, said that most of my country's current IT underlying standards, architectures and products are formulated by US IT companies. We have always been stuck and controlled by others. With the strong policy support given by the state, we must establish our own standards to make the localized industry more sound and standardized. We hope to improve the current chaotic storage market conditions through more technological methods and make the storage industry more three-dimensional and more standardized.

Li Silin, general manager of Futurepath Wuhan, pointed out that the current domestic market does not have very clear specifications for the storage industry. In order to reduce costs, the quality of flash memory continues to decline, and the lifespan is getting lower and lower. The quality characteristics of the same batch of flash memory particles are not the same. Applications in different industries have different requirements for the quality characteristics of the required storage products.

It is in this industry environment that Futurepath invented life prediction technology and an intelligent test system for flash memory chips, which can accurately detect and analyze the quality of flash memory particles. Among the company’s current products, Futurepath’s test systems are available from portable, production versions, and scientific research versions, which can meet the different needs of scientific research units, manufacturers, testing centers, etc., and will continue to launch EMMC/UFS for embedded devices in the future. Wait for the test system.

At the meeting, several brand companies reached a cooperation intention with Futurepath and visited the Fortune Technology Flash Chip Quality Research Laboratory to jointly contribute to the process of flash memory quality standardization.

With the vigorous development of the storage industry, the launch of Futurepath's unique intelligent test system for flash memory chips will represent an important significance, becoming a bridge between enterprises, helping upstream and downstream to develop synergistically, and contributing a meager force to promoting the localization of the storage industry.