General screening methods and pros and cons of flash memory chips currently on the market

In the past two years, another wave of "new infrastructure" has been set off. New technologies represented by 5G, artificial intelligence, industrial Internet, and big data centers have attracted much attention. The new infrastructure will drive the growth of data centers, thereby driving the entire The development of the digital industry.

With the increasing demand in the domestic storage market, the existing problems have become more and more prominent.

The flash memory chip has the possibility of code loss, and the chip itself has a life limit. Once the code is lost or the chip life is too short, the electronic product will experience failures such as the system cannot be started, the key functions cannot be turned on, and so on, which will bring losses to customers.

Therefore, the reliability and quality of flash memory chip products will be the key indicators for customers to evaluate and pay attention to.

There are several flash screening methods currently available in the market in my country:

1. Test with Flash test stand

Due to the strong error correction capability of the main controller itself, it will continuously correct NAND errors during the test process, temporarily concealing the quality defects of the Flash, resulting in a short-term test that cannot expose potentially risky bad blocks in the SSD.

2. The test life of the finished product needs to be repeatedly erased and written until it is damaged

Although such a test method can effectively test the service life of the Flash, the entire process takes a long time. The entire disk needs to be repeatedly erased and written until it is damaged, which often takes several months and consumes a lot of manpower and time costs. At the same time, due to the destructive nature of traditional testing techniques, the finished product will be unusable after the test is completed.

3. Generally, life test is not carried out, or sampling test

At present, the storage market demand continues to expand, and some companies cannot perform full inspections of their products, and can only conduct random inspections or even non-inspections. With the continuous writing of data, the service life of flash memory chips is getting shorter and shorter. If the life expectancy is not carried out, there will be great data security risks. Secondly, even for the same batch of products, there are differences in the life of flash memory chips, and neither sampling tests nor samples can guarantee the life of the overall Flash.

4. Test after producing flash memory chips into finished products

Repairs due to poor or compatibility issues caused by different quality of flash memory will greatly increase production costs and quality risks after shipment.

Therefore, under the current market demand scale, how to efficiently and accurately identify the quality of flash memory chips has become a common challenge faced by storage companies in different fields.

Fortune Technology

* Unique flash memory intelligent detection technology and equipment, which can perform particle-level non-destructive testing on flash memory;

* The core artificial intelligence algorithm technology can predict its life with high accuracy;

* According to the quality characteristics of flash memory, it is divided into different levels;

* Provide an intuitive data reference for the product application of flash memory, thereby helping customers to better apply to different industries.

(Part of the test data diagram is for reference)